The PeakForce Kelvin Probe Force Microscopy-HV mode maps the electrostatic potential at the sample surface by applying an AC voltage to the probe and measuring harmonics of that voltage. This AC technique extends the measurement range of AM-KPFM (see Lift Mode Surface Potential Imaging (AM-KPFM)) up to approximately ±200 V.
PeakForce KPFM-HV also leverages the advantages of PeakForce Tapping:
PeakForce KPFM HV requires a PF KPFM-HV Application Module, shown in Figure 6.
Figure 6: The PF KPFM-HV Application Module (Dimension SPMs only)
The PF-KPFM HV Application Module requires an Applications Module Probe Holder. Either the Dimension SCM Probe Holder or the Dimension SSRM, TUNA and C-AFM Probe Holder will work.
Bruker recommends PFQNE-AL probes for PeakForce KPFM-HV measurements.
Prepare the sample as described in Electrical Sample Preparation.
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Figure 7: The PF KPFM-HV Select Experiment window
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Figure 8: Align the laser on the cantilever and place the crosshair there.
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